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"An Introduction to Mixed-signal IC Test and Measurement"

♥ Book Title : An Introduction to Mixed-signal IC Test and Measurement
♣ Name Author : Mark Burns
∞ Launching : 2001
◊ Info ISBN Link : 0195140168
⊗ Detail ISBN code : 9780195140163
⊕ Number Pages : Total 684 sheet
♮ News id : pfO9wAEACAAJ

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☯ Full Synopsis : "Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Mixed-signal IC test and measurement has grown into a highly specialized field of electrical engineering. It has become harder to hire and train new engineers to become skilled mixed-signal test engineers. The slow learning curve for mixed-signal test engineers is largely due to the shortage of written materials and university-level courses on the subject of mixed-signal testing. While many books have been devoted to the subject of digital test and testability, the same cannot be said for analog and mixed-signal automated test and measurement. This book was written in response ot the shortage of basic course material for mixed-signal test and measurement. The book assumes a solid background in analog and digital circuits as well as a working knowledge of computers and computer programming. A background in digital signal processing and statistical analysis is also helpful, though not absolutely necessary. This material is designed to be useful as both a university textbook and as a reference manual for the beginning professional test engineer. The prerequisite for this book is a junior level course in linear continuous-time and discrete-time systems, as well as exposure ot elementary probability and statistical concepts. Chapter 1 presents an introduction to the context in which mixed-singal testing is performed and why it is necessary. Chapter 2 examines the process by which test programs are generated, from device data sheet to test plan to test code. Test program structure and functionality are also discussed in Chapter 2. Chapter 3 introduces basic DC measurement definitions, including continuity, leakage, offset, gain, DC power supply rejection ratio, and many other types of fundamental DC measurements. Chapter 4 covers the basics of absolute accuracy, resolution, software calibration, standards traceability, and measurement repeatability. In addition, basic data analysis is presented in Chapter 4. A more thorough treatment of data analysis and statistical analysis is delayed until Chapter 15. Chapter 5 takes a closer look at the architecture of a generic mixed-signal ATE tester. The generic tester includes instruments such as DC sources, meters, waveform digitizers, arbitrary waveform generators, and digital pattern generators with source and capture functionality. Chapter 6 presents an introduction to both ADC and DAC sampling theory. DAC sampling theory is applicable to both DAC circuits in the device under test and to the arbitrary waveform generators in a mixed-signal tester. ADC sampling theory is applicable to both ADC circuits in the device under test and to waveform digitizers in a mixed-signal tester. Coherent multi-tone sample sets are also introduced as an introduction to DSP based testing. Chapter 7 further develops sampling theory concepts and DSP-based testing methodologies, which are at the core of many mixed-signal test and measurement techniques. FFT fundamentals, windowing, frequency domain filtering, and other DSP-based testing fundamentals are covered in Chapter 6 and 7. Chapter 8 shows how basic AC channel tests can be performed economicaly using DSP-based testing. This chapter covers only non-sampled channels, consisting of combinations of op-amps, analog filters, PGAs and other continuous-time circuits. Chapter 9 explores many of these same tests as they are applied to sampled channels, which include DACs, ADCs, sample and hold (S/H) amplifiers, etc. Chapter 10 explains how the basic accuracy of ATE test equipment can be extended using specialized software routines. This subject is not necessarily taught in formal ATE tester classes, yet it is critical in the accurate measurement of many DUT performance parameters. Testing of DACs is covered in Chapter 11. Several kinds of DACs are studied, including traditional binary-weighted, resistive ladder, pulse with modulation (PWM), and sigma delta architectures. Traditional measurements like INL, DNL and absolute error are discussed. Chapter 12 builds upon the concepts in Chapter 11 to show how ADCs are commonly tested. Again, several different kinds of ADC's are studied, including binary-weighted, dual-slope, flash, semi-flash, and sigma-delta architectures. The weaknesses of each design are expalined, as well as the common methodologies used to probe their weaknesses. Chapter 13 explores the gray art of mixed-signal DIB design. Topics of interest include component selection, power and ground layout, crosstalk, shielding, transmission lines, and tester loading. Chapter 13 also illustrates several common DIB circuits and their use in mixed-signal testing. Chapter 14 gives a brief introduction to some of the techniques for analog and mixed-signal design for test. There are fewer structured approaches for mixed-signal DfT than for purely digital DfT. The more common ad-hoc methods are explained, as well as some of the industry standards such as IEEE Std. 1149.1 and 1149.4. A brief review of statistical analysis and Gaussian distributions is presented in Chapter 15. This chapter also shows how measurement results can be analyzed and viewed using a variety of software tools and display formats. Datalogs, shmoo plots, and histograms are discussed. Also, statistical process control (SPC) is explained, including a discussion of process control metrics such as Cp and Cpk. Chapter 16 examines the economis of production testing, The economics of testing are affected by many factors such as equipment purchase price, test floor overhead costs, test time, dual-head testing, multi-site testing, and time to market. A test engineer's debugging skills heavily impacts time to market. Chapter 16 examines the test debugging process to attempt to set down some general guidelines for debugging mixed-signal test programs. Finally, emerging trends that affect test economics and test development time are presented in Chapter 16. Some or all these trends will shape the future course of mixed-siganl test and measurement."Article| Mark Burns| Statement ..."

"An Introduction to Mixed-signal IC Test and Measurement"

♥ Book Title : An Introduction to Mixed-signal IC Test and Measurement
♣ Name Author : Mark Burns
∞ Launching : 2001
◊ Info ISBN Link : 0195140168
⊗ Detail ISBN code : 9780195140163
⊕ Number Pages : Total 684 sheet
♮ News id : TOe0QkSiUhMC

Download FileStart Reading

☯ Full Synopsis : "Integrated circuits incorporating both digital and analog functions have become increasingly prevalent in the semiconductor industry. Mixed-signal IC test and measurement has grown into a highly specialized field of electrical engineering. It has become harder to hire and train new engineers to become skilled mixed-signal test engineers. The slow learning curve for mixed-signal test engineers is largely due to the shortage of written materials and university-level courses on the subject of mixed-signal testing. While many books have been devoted to the subject of digital test and testability, the same cannot be said for analog and mixed-signal automated test and measurement. This book was written in response ot the shortage of basic course material for mixed-signal test and measurement. The book assumes a solid background in analog and digital circuits as well as a working knowledge of computers and computer programming. A background in digital signal processing and statistical analysis is also helpful, though not absolutely necessary. This material is designed to be useful as both a university textbook and as a reference manual for the beginning professional test engineer. The prerequisite for this book is a junior level course in linear continuous-time and discrete-time systems, as well as exposure ot elementary probability and statistical concepts. Chapter 1 presents an introduction to the context in which mixed-singal testing is performed and why it is necessary. Chapter 2 examines the process by which test programs are generated, from device data sheet to test plan to test code. Test program structure and functionality are also discussed in Chapter 2. Chapter 3 introduces basic DC measurement definitions, including continuity, leakage, offset, gain, DC power supply rejection ratio, and many other types of fundamental DC measurements. Chapter 4 covers the basics of absolute accuracy, resolution, software calibration, standards traceability, and measurement repeatability. In addition, basic data analysis is presented in Chapter 4. A more thorough treatment of data analysis and statistical analysis is delayed until Chapter 15. Chapter 5 takes a closer look at the architecture of a generic mixed-signal ATE tester. The generic tester includes instruments such as DC sources, meters, waveform digitizers, arbitrary waveform generators, and digital pattern generators with source and capture functionality. Chapter 6 presents an introduction to both ADC and DAC sampling theory. DAC sampling theory is applicable to both DAC circuits in the device under test and to the arbitrary waveform generators in a mixed-signal tester. ADC sampling theory is applicable to both ADC circuits in the device under test and to waveform digitizers in a mixed-signal tester. Coherent multi-tone sample sets are also introduced as an introduction to DSP based testing. Chapter 7 further develops sampling theory concepts and DSP-based testing methodologies, which are at the core of many mixed-signal test and measurement techniques. FFT fundamentals, windowing, frequency domain filtering, and other DSP-based testing fundamentals are covered in Chapter 6 and 7. Chapter 8 shows how basic AC channel tests can be performed economicaly using DSP-based testing. This chapter covers only non-sampled channels, consisting of combinations of op-amps, analog filters, PGAs and other continuous-time circuits. Chapter 9 explores many of these same tests as they are applied to sampled channels, which include DACs, ADCs, sample and hold (S/H) amplifiers, etc. Chapter 10 explains how the basic accuracy of ATE test equipment can be extended using specialized software routines. This subject is not necessarily taught in formal ATE tester classes, yet it is critical in the accurate measurement of many DUT performance parameters. Testing of DACs is covered in Chapter 11. Several kinds of DACs are studied, including traditional binary-weighted, resistive ladder, pulse with modulation (PWM), and sigma delta architectures. Traditional measurements like INL, DNL and absolute error are discussed. Chapter 12 builds upon the concepts in Chapter 11 to show how ADCs are commonly tested. Again, several different kinds of ADC's are studied, including binary-weighted, dual-slope, flash, semi-flash, and sigma-delta architectures. The weaknesses of each design are expalined, as well as the common methodologies used to probe their weaknesses. Chapter 13 explores the gray art of mixed-signal DIB design. Topics of interest include component selection, power and ground layout, crosstalk, shielding, transmission lines, and tester loading. Chapter 13 also illustrates several common DIB circuits and their use in mixed-signal testing. Chapter 14 gives a brief introduction to some of the techniques for analog and mixed-signal design for test. There are fewer structured approaches for mixed-signal DfT than for purely digital DfT. The more common ad-hoc methods are explained, as well as some of the industry standards such as IEEE Std. 1149.1 and 1149.4. A brief review of statistical analysis and Gaussian distributions is presented in Chapter 15. This chapter also shows how measurement results can be analyzed and viewed using a variety of software tools and display formats. Datalogs, shmoo plots, and histograms are discussed. Also, statistical process control (SPC) is explained, including a discussion of process control metrics such as Cp and Cpk. Chapter 16 examines the economis of production testing, The economics of testing are affected by many factors such as equipment purchase price, test floor overhead costs, test time, dual-head testing, multi-site testing, and time to market. A test engineer's debugging skills heavily impacts time to market. Chapter 16 examines the test debugging process to attempt to set down some general guidelines for debugging mixed-signal test programs. Finally, emerging trends that affect test economics and test development time are presented in Chapter 16. Some or all these trends will shape the future course of mixed-siganl test and measurement."Article| Mark Burns| Statement ..."

"Testing Static Random Access Memories"

♥ Book Title : Testing Static Random Access Memories
♣ Name Author : Said Hamdioui
∞ Launching : 2013-06-29
◊ Info ISBN Link : 9781475767063
⊗ Detail ISBN code : 1475767064
⊕ Number Pages : Total 221 sheet
♮ News id : fWbaBwAAQBAJ

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☯ Full Synopsis : "Testing Static Random Access Memories covers testing of one of the important semiconductor memories types; it addresses testing of static random access memories (SRAMs), both single-port and multi-port. It contributes to the technical acknowledge needed by those involved in memory testing, engineers and researchers. The book begins with outlining the most popular SRAMs architectures. Then, the description of realistic fault models, based on defect injection and SPICE simulation, are introduced. Thereafter, high quality and low cost test patterns, as well as test strategies for single-port, two-port and any p-port SRAMs are presented, together with some preliminary test results showing the importance of the new tests in reducing DPM level. The impact of the port restrictions (e.g., read-only ports) on the fault models, tests, and test strategies is also discussed. Features: -Fault primitive based analysis of memory faults, -A complete framework of and classification memory faults, -A systematic way to develop optimal and high quality memory test algorithms, -A systematic way to develop test patterns for any multi-port SRAM, -Challenges and trends in embedded memory testing."Article| Said Hamdioui| Statement ..."

"VLSI Testing"

♥ Book Title : VLSI Testing
♣ Name Author : Stanley Leonard Hurst
∞ Launching : 1998
◊ Info ISBN Link : 0852969015
⊗ Detail ISBN code : 9780852969014
⊕ Number Pages : Total 532 sheet
♮ News id : AHHYVkNLTZsC

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☯ Full Synopsis : "This book is a self-contained introduction to all aspects of microelectronic (IC) testing. It includes the theory necessary for advanced students as well as reference to industrial practice and economics that will interest designers in industry. Chapters cover both digital circuit testing and the growing area of mixed circuits, used particularly in signal processing."Article| Stanley Leonard Hurst| Statement ..."

"Fault Diagnosis of Analog Integrated Circuits"

♥ Book Title : Fault Diagnosis of Analog Integrated Circuits
♣ Name Author : Prithviraj Kabisatpathy
∞ Launching : 2006-01-13
◊ Info ISBN Link : 9780387257433
⊗ Detail ISBN code : 0387257438
⊕ Number Pages : Total 182 sheet
♮ News id : a9CummPmDDEC

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☯ Full Synopsis : "Enables the reader to test an analog circuit that is implemented either in bipolar or MOS technology. Examines the testing and fault diagnosis of analog and analog part of mixed signal circuits. Covers the testing and fault diagnosis of both bipolar and Metal Oxide Semiconductor (MOS) circuits and introduces . Also contains problems that can be used as quiz or homework."Article| Prithviraj Kabisatpathy| Statement ..."

"Analog and Mixed-Signal Electronics"

♥ Book Title : Analog and Mixed-Signal Electronics
♣ Name Author : Karl Stephan
∞ Launching : 2015-04-06
◊ Info ISBN Link : 9781118782668
⊗ Detail ISBN code : 1118782666
⊕ Number Pages : Total 536 sheet
♮ News id : a1XHBgAAQBAJ

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☯ Full Synopsis : "The book begins with an introduction to analog and mixed-signal electronics, their applications, and a brief history of analog electronics and their relevance following the digital revolution. The author addresses the types of measurement instruments necessary for the electronics designer, such as power meters, oscilloscopes, spectrum analyzers, and power and signal sources. Readers will learn the basics of linear systems, types of nonlinearities and their effects, op-amp circuits, the high-gain analog filter-amplifier, and signal generation. Design examples include an electric guitar preamp and a crystal-controlled clock generator."Article| Karl Stephan| Statement ..."

"Analog and Mixed-signal Test"

♥ Book Title : Analog and Mixed-signal Test
♣ Name Author : Bapiraju Vinnakota
∞ Launching : 1998
◊ Info ISBN Link : 0137863101
⊗ Detail ISBN code : 9780137863105
⊕ Number Pages : Total 261 sheet
♮ News id : BCxTAAAAMAAJ

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☯ Full Synopsis : "A comprehensive guide to analog and mixed-signal IC testing. It reviews the potential testing options for analog and mixed-signal ICs, enabling designers, engineers, CAD developers and researchers to choose the most cost-effective, accurate solution. It outlines the state-of-the-art in analog testing."Article| Bapiraju Vinnakota| Statement ..."

"Low Power Design Essentials"

♥ Book Title : Low Power Design Essentials
♣ Name Author : Jan Rabaey
∞ Launching : 2009-04-21
◊ Info ISBN Link : 0387717137
⊗ Detail ISBN code : 9780387717135
⊕ Number Pages : Total 366 sheet
♮ News id : A-sBy_nmQ8wC

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☯ Full Synopsis : "This book contains all the topics of importance to the low power designer. It first lays the foundation and then goes on to detail the design process. The book also discusses such special topics as power management and modal design, ultra low power, and low power design methodology and flows. In addition, coverage includes projections of the future and case studies."Article| Jan Rabaey| Statement ..."

"System-on-Chip Test Architectures"

♥ Book Title : System-on-Chip Test Architectures
♣ Name Author : Laung-Terng Wang
∞ Launching : 2010-07-28
◊ Info ISBN Link : 0080556809
⊗ Detail ISBN code : 9780080556802
⊕ Number Pages : Total 896 sheet
♮ News id : wB2p1haoK_8C

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☯ Full Synopsis : "Modern electronics testing has a legacy of more than 40 years. The introduction of new technologies, especially nanometer technologies with 90nm or smaller geometry, has allowed the semiconductor industry to keep pace with the increased performance-capacity demands from consumers. As a result, semiconductor test costs have been growing steadily and typically amount to 40% of today's overall product cost. This book is a comprehensive guide to new VLSI Testing and Design-for-Testability techniques that will allow students, researchers, DFT practitioners, and VLSI designers to master quickly System-on-Chip Test architectures, for test debug and diagnosis of digital, memory, and analog/mixed-signal designs. Emphasizes VLSI Test principles and Design for Testability architectures, with numerous illustrations/examples. Most up-to-date coverage available, including Fault Tolerance, Low-Power Testing, Defect and Error Tolerance, Network-on-Chip (NOC) Testing, Software-Based Self-Testing, FPGA Testing, MEMS Testing, and System-In-Package (SIP) Testing, which are not yet available in any testing book. Covers the entire spectrum of VLSI testing and DFT architectures, from digital and analog, to memory circuits, and fault diagnosis and self-repair from digital to memory circuits. Discusses future nanotechnology test trends and challenges facing the nanometer design era; promising nanotechnology test techniques, including Quantum-Dots, Cellular Automata, Carbon-Nanotubes, and Hybrid Semiconductor/Nanowire/Molecular Computing. Practical problems at the end of each chapter for students."Article| Laung-Terng Wang| Statement ..."

"Test and Design-for-Testability in Mixed-Signal Integrated Circuits"

♥ Book Title : Test and Design-for-Testability in Mixed-Signal Integrated Circuits
♣ Name Author : Jose Luis Huertas Díaz
∞ Launching : 2010-02-23
◊ Info ISBN Link : 9780387235219
⊗ Detail ISBN code : 0387235213
⊕ Number Pages : Total 298 sheet
♮ News id : 2zP0BwAAQBAJ

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☯ Full Synopsis : "Test and Design-for-Testability in Mixed-Signal Integrated Circuits deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is becoming a true bottleneck of present and future IC projects. Linking design and test in these heterogeneous systems will have a tremendous impact in terms of test time, cost and proficiency. Although it is recognized as a key issue for developing complex ICs, there is still a lack of structured references presenting the major topics in this area. The aim of this book is to present basic concepts and new ideas in a manner understandable for both professionals and students. Since this is an active research field, a comprehensive state-of-the-art overview is very valuable, introducing the main problems as well as the ways of solution that seem promising, emphasizing their basis, strengths and weaknesses. In essence, several topics are presented in detail. First of all, techniques for the efficient use of DSP-based test and CAD test tools. Standardization is another topic considered in the book, with focus on the IEEE 1149.4. Also addressed in depth is the connecting design and test by means of using high-level (behavioural) description techniques, specific examples are given. Another issue is related to test techniques for well-defined classes of integrated blocks, like data converters and phase-locked-loops. Besides these specification-driven testing techniques, fault-driven approaches are described as they offer potential solutions which are more similar to digital test methods. Finally, in Design-for-Testability and Built-In-Self-Test, two other concepts that were taken from digital design, are introduced in an analog context and illustrated for the case of integrated filters. In summary, the purpose of this book is to provide a glimpse on recent research results in the area of testing mixed-signal integrated circuits, specifically in the topics mentioned above. Much of the work reported herein has been performed within cooperative European Research Projects, in which the authors of the different chapters have actively collaborated. It is a representative snapshot of the current state-of-the-art in this emergent field."Article| Jose Luis Huertas Díaz| Statement ..."

"Understanding Digital Signal Processing"

♥ Book Title : Understanding Digital Signal Processing
♣ Name Author : no defined
∞ Launching :
◊ Info ISBN Link : 8131721442
⊗ Detail ISBN code : 9788131721445
⊕ Number Pages : Total 233 sheet
♮ News id : QTnUzsbqtMEC

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☯ Full Synopsis : ""Article| no defined| Statement ..."

"Introduction to Engineering Design, Book 11, 4th Edition"

♥ Book Title : Introduction to Engineering Design, Book 11, 4th Edition
♣ Name Author : Jim Dally
∞ Launching : 2017-04-28
◊ Info ISBN Link : 193567336X
⊗ Detail ISBN code : 9781935673361
⊕ Number Pages : Total 233 sheet
♮ News id : TS6kswEACAAJ

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☯ Full Synopsis : "This title contains information for first year engineering students to build quadcopters and to fly them under RC control and to perform a cargo delivery mission under autonomous control. It also contains many chapters of introductory information for engineering students."Article| Jim Dally| Statement ..."